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Integrated model for the batch sequencing problem in a multi-stage supply chain: an artificial immune system based approach

Shukla, M.; Shukla, N.; Tiwari, M.K.; Chan, F.T.S. - In: International journal of production research : American … 47 (2009) 4, pp. 1015-1038

Persistent link: https://www.econbiz.de/10008164522

Optimal sensor distribution for multi-station assembly process using chaos-embedded fast-simulated annealing

Shukla, N.; Tiwari, Manoj Kumar; Shankar, R. - In: International journal of production research 47 (2009) 1, pp. 187-211

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A self-organized neural network metamodelling and clonal selection optimization-based approach for the design of a manufacturing system

Anand, R.B.; Tiwari, M.K.; Shankar, R. - In: International journal of production research : American … 44 (2006) 6, pp. 1147-1170

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Kernel distance-based robust support vector methods and its application in developing a robust K-chart

Kumar, S.; Choudhary, A.K.; Kumar, M.; Shankar, R.; … - In: International journal of production research : American … 44 (2006) 1, pp. 77-96

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Expert Enhanced Coloured Stochastic Petri Net and its application in assembly-disassembly

Kumar, S.; Kumar, R.; Shankar, R.; Tiwari, M.K. - In: International journal of production research : American … 41 (2003) 12, pp. 2727-2762

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Sequencing of parts on single-stage multifunctional machining systems using a chaos-embedded simulated annealing algorithm

Bachlaus, M.; Tiwari, M.K.; Shankar, R. - In: International journal of production research : American … 46 (2008) 12, pp. 3387-3414

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Facility layout problem: an approach based on a group decision-making system and psychoclonal algorithm

Khilwani, N.; Shankar, R.; Tiwari, M.K. - In: International journal of production research : American … 46 (2008) 4, pp. 895-928

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Knowledge discOvery And daTa minINg inteGrated (KOATING) Moderators for collaborative projects

Choudhary, A.K.; Harding, J.A.; Lin, H.K.; Tiwari, M.K.; … - In: International journal of production research : American … 49 (2011) 23, pp. 7029-7058

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Fixed-width confidence intervals for contrasts in the means

Chaturvedi, Ajit; Shukla, N.; Shukla, Pramod - In: Annals of the Institute of Statistical Mathematics 44 (1992) 1, pp. 157-167

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Unbiased product estimators

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