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An effective defect inspection system for polarized film images using image segmentation and template matching techniques
Yoon, Young-Geun; Lee, Seok-Lyong; Chung, Chin-Wan; … - In: Computers & industrial engineering : CAIE ; an … 55 (2008) 3, pp. 567-583
Persistent link: https://www.econbiz.de/10008109102
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An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses
Noh, Chung-Ho; Lee, Seok-Lyong; Kim, Deok-Hwan; Chung, … - In: International journal of production research : American … 48 (2010) 17, pp. 5115-5136
Persistent link: https://www.econbiz.de/10008435778
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An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses
Noh, Chung-ho; Lee, Seok-lyong; Kim, Deok-hwan; Chung, … - In: International journal of production research 48 (2010) 17/18, pp. 5115-5135
Persistent link: https://www.econbiz.de/10009125446
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Space-efficient cubes for OLAP range-sum queries
Chun, Seok-Ju; Chung, Chin-Wan; Lee, Seok-Lyong - In: Decision support systems : DSS ; the international journal 37 (2004) 1, pp. 83-102
Persistent link: https://www.econbiz.de/10006165994
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An Efficient Data Structure for Organizing Multidimensional Data
Cha, Guang-Ho; Chung, Chin-Wan - In: Journal of database management : JDM ; an official … 8 (1997) 4, pp. 3-15
Persistent link: https://www.econbiz.de/10008219776