ZHAI, Z. Y.; LI, X. Z.; ZHI, S. S.; WU, X. S.; HAO, J. H.; … - In: Surface Review and Letters (SRL) 14 (2007) 04, pp. 779-782
SrTiO3 films are fabricated on DyScO3 substrates by pulse laser deposition. In situ X-ray diffraction (XRD) is used to characterize the thermal expansion coefficient at low temperature. The abnormal behavior in lattice parameter at 80 K may be the hint of a phase transition. High resolution XRD...