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Semiparametric Analysis of Recurrent Events Data in the Presence of Dependent Censoring

Ghosh, Debashis; Lin, D. Y. - 2003

Dependent censoring occurs in longitudinal studies of recurrent events when the censoring time depends on the potentially unobserved recurrent event times. To perform regression analysis in this setting, we propose a semiparametric joint model that formulates the marginal distributions of the...

Persistent link: https://www.econbiz.de/10009476569

Efficient Estimation of Semiparametric Transformation Models for Two-Phase Cohort Studies

Zeng, Donglin; Lin, D. Y. - In: Journal of the American Statistical Association 109 (2014) 505, pp. 371-383

Under two-phase cohort designs, such as case--cohort and nested case--control sampling, information on observed event times, event indicators, and inexpensive covariates is collected in the first phase, and the first-phase information is used to select subjects for measurements of expensive...

Persistent link: https://www.econbiz.de/10010824034

Nonparametric Tests for the Gap Time Distributions of Serial Events Based on Censored Data

Lin, D. Y.; Ying, Zhiliang - In: Biometrics 57 (2001) 2, pp. 369-375

Persistent link: https://www.econbiz.de/10010946497

Semiparametric Methods for Mapping Quantitative Trait Loci with Censored Data

Diao, Guoqing; Lin, D. Y. - In: Biometrics 61 (2005) 3, pp. 789-798

Persistent link: https://www.econbiz.de/10010946823

Semiparametric Transformation Models with Random Effects for Joint Analysis of Recurrent and Terminal Events

Zeng, Donglin; Lin, D. Y. - In: Biometrics 65 (2009) 3, pp. 746-752

Persistent link: https://www.econbiz.de/10010946923

Proportional Means Regression for Censored Medical Costs

Lin, D. Y. - In: Biometrics 56 (2000) 3, pp. 775-778

Persistent link: https://www.econbiz.de/10010947234

Nonparametric Analysis of Recurrent Events and Death

Ghosh, Debashis; Lin, D. Y. - In: Biometrics 56 (2000) 2, pp. 554-562

Persistent link: https://www.econbiz.de/10010947269

Survival Analysis in Clinical Trials: Past Developments and Future Directions

Fleming, Thomas R.; Lin, D. Y. - In: Biometrics 56 (2000) 4, pp. 971-983

Persistent link: https://www.econbiz.de/10010947333

Letter to the Editor of Biometrics

Greenland, Sander; Lin, D. Y.; Kronmal, R. A.; Psaty, B. M. - In: Biometrics 55 (1999) 3, pp. 990-991

Persistent link: https://www.econbiz.de/10010947384

Model-Checking Techniques Based on Cumulative Residuals

Lin, D. Y.; Wei, L. J.; Ying, Z. - In: Biometrics 58 (2002) 1, pp. 1-12

Persistent link: https://www.econbiz.de/10010947488

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