Uccio, U. Scotti di; Bevilacqua, F.; Condorelli, G.; … - In: The European Physical Journal B - Condensed Matter and … 41 (2004) 1, pp. 3-9
Clear evidence about the influence of growth orientation on the stoichiometry of sputtered oxide thin films is reported and discussed. The growth of stoichiometric and of non-stoichiometric films is respectively obtained, from the same CaRuO<Subscript>3</Subscript> target, on the surface of (110) and (100) perovskite...</subscript>