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Keats, J.
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Deely, J.
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Lawson, C.
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McElwain, D.
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IEEE transactions on reliability : R ; IEEE T R
2
Psychometrika
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1
Multidimensional unfolding: Some geometrical solutions
McElwain, D.
;
Keats, J.
- In:
Psychometrika
26
(
1961
)
3
,
pp. 325-332
Persistent link: https://www.econbiz.de/10005166488
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2
A theoretical distribution for mental test scores
Keats, J.
;
Lord, Frederic
- In:
Psychometrika
27
(
1962
)
1
,
pp. 59-72
Persistent link: https://www.econbiz.de/10005381555
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3
Comparison of robust and least-squares regression in computer-generated probability plots
Lawson, C.
;
Keats, J.
;
Montgomery, D.
- In:
IEEE transactions on reliability : R ; IEEE T R
46
(
1997
)
1
,
pp. 108-115
Persistent link: https://www.econbiz.de/10006631066
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4
Bayes stopping-rules for reliability testing with the exponential distribution
Deely, J.
;
Keats, J.
- In:
IEEE transactions on reliability : R ; IEEE T R
43
(
1994
)
2
,
pp. 288-293
Persistent link: https://www.econbiz.de/10006636982
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