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Analysis of field data under two-dimensional warranty
Jung, M.; Bai, D.S. - In: Reliability engineering & system safety 92 (2007) 2, pp. 135-143
Persistent link: https://www.econbiz.de/10007391647
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Field data analyses with additional after-warranty failure data
Oh, Y.S.; Bai, D.S. - In: Reliability engineering & system safety 72 (2001) 1, pp. 1-8
Persistent link: https://www.econbiz.de/10006834201
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Failure-censored Accelerated Life Test Sampling Plans for Weibull Distribution Under Expected Test Time Constraint
Bai, D.S.; Chun, Y.R.; Kim, J.G. - In: Reliability engineering & system safety 50 (1995) 1, pp. 61-68
Persistent link: https://www.econbiz.de/10006859630
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Nonparametric Inferences for Ramp Stress Tests Under Random Censoring
Bai, D.S.; Chun, Y.R. - In: Reliability engineering & system safety 41 (1993) 3, pp. 217-224
Persistent link: https://www.econbiz.de/10006869451
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Optimal Design of Partially Accelerated Life Tests for the Lognormal Distribution Under Type I Censoring
Bai, D.S.; Chung, S.W.; Chun, Y.R. - In: Reliability engineering & system safety 40 (1993) 1, pp. 85-92
Persistent link: https://www.econbiz.de/10006869503
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Lifetime and reliability estimation of repairable redundant system subject to periodic alternation
Seo, J.H.; Jang, J.S.; Bai, D.S. - In: Reliability engineering & system safety 80 (2003) 2, pp. 197-204
Persistent link: https://www.econbiz.de/10006823176