Narrow search
Showing 1 - 4 of 4
Cover Image
Multi-process capability plot and fuzzy inference evaluation
Chen, K.S.; Chen, T.W. - In: International Journal of Production Economics 111 (2008) 1, pp. 70-79
Persistent link: https://www.econbiz.de/10005318251
Cover Image
Multi-process capability plot and fuzzy inference evaluation
Chen, K.S.; Chen, T.W. - In: International journal of production economics 111 (2008) 1, pp. 70-79
Persistent link: https://www.econbiz.de/10007896186
Cover Image
Measuring Production Performance of Different Product Mixes in Semiconductor Fabrication
Chung, S.-H.; Pearn, W.L.; Lee, A.H.I. - In: International journal of industrial engineering : … 13 (2006) 1, pp. 5-17
Persistent link: https://www.econbiz.de/10007268017
Cover Image
Control wafers inventory management in the wafer fabrication photolithography area
Chung, S.-H.; Pearn, W.L.; Kang, H.-Y. - In: Production planning & control : PPC 16 (2005) 3, pp. 286-296
Persistent link: https://www.econbiz.de/10007149657