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A review of yield modelling techniques for semiconductor manufacturing
Kumar, N.; Kennedy, K.; Gildersleeve, K.; Abelson, R.; … - In: International journal of production research : American … 44 (2006) 23, pp. 5019-5036
Persistent link: https://www.econbiz.de/10007305723
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Experimental design for product and process design and development (with comments)
Montgomery, D.C. - In: The statistician : journal of the Institute of Statisticians 48 (1999) 2, pp. 159-178
Persistent link: https://www.econbiz.de/10007338785
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Introduction to Statistical Quality Control, 3rd Edition
Montgomery, D.C.; Gerth, R. - In: IIE transactions / Institute of Industrial Engineers, … 30 (1998) 6, pp. 571
Persistent link: https://www.econbiz.de/10006199137
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Introduction to Statistical Quality Control, 3rd Edition
Montgomery, D.C.; Gerth, R. - In: IIE transactions / Institute of Industrial Engineers, … 30 (1998) 6, pp. 571
Persistent link: https://www.econbiz.de/10006199151
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Selection of the subgroup size and sampling interval for a CUSUM control chart
Prabhu, S.S.; Runger, G.C.; Montgomery, D.C. - In: IIE transactions / Institute of Industrial Engineers, … 29 (1997) 6, pp. 451-458
Persistent link: https://www.econbiz.de/10006204863
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Multiple-criteria optimal design of X control charts
Castillo, E.Del; Mackin, P.; Montgomery, D.C. - In: IIE transactions / Institute of Industrial Engineers, … 28 (1996) 6, pp. 467-474
Persistent link: https://www.econbiz.de/10006207717
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A general model for the optimal economic design of X charts used to control short or long run processes
Del Castillo, E.; Montgomery, D.C. - In: IIE transactions / Institute of Industrial Engineers, … 28 (1996) 3, pp. 193-202
Persistent link: https://www.econbiz.de/10006208855
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A review of multivariate control charts
Lowry, C.A.; Montgomery, D.C. - In: IIE transactions / Institute of Industrial Engineers, … 27 (1995) 6, pp. 800-810
Persistent link: https://www.econbiz.de/10006212852
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System Comparison Procedures for Automatic Target Recognition Systems
Catlin, A.E.; Bauer Jr, K.W.; Mykytka, E.F.; … - In: Naval research logistics : an international journal 46 (1999) 4, pp. 357-372
Persistent link: https://www.econbiz.de/10005968545
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A Robust Regression Technique Using Compound Estimation
Simpson, J.R.; Montgomery, D.C. - In: Naval research logistics : an international journal 45 (1998) 2, pp. 125-140
Persistent link: https://www.econbiz.de/10005978786