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Gupta, V.K.
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Metron : international journal of statistics
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Outliers in block designs for diallel crosses
Sarker, S.
;
Parsad, R.
;
Gupta, V.K.
- In:
Metron : international journal of statistics
63
(
2005
)
2
,
pp. 177-192
Persistent link: https://www.econbiz.de/10006544719
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