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Analysis of quality-caused re-entrance electrical test system in semiconductor manufacturing by Markov method
Li, N.; Jiang, Z.; Liu, G.; Zhang, Z. - In: International journal of production research : American … 50 (2012) 12, pp. 3486-3498
Persistent link: https://www.econbiz.de/10009985763
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Capacity planning with reconfigurable kits in semiconductor test manufacturing
Zhang, Z.; Zhang, M.T.; Niu, S.; Zheng, L. - In: International journal of production research : American … 44 (2006) 13, pp. 2625-2644
Persistent link: https://www.econbiz.de/10007261631
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Production research in China
Chaudhry, S.; Feng, S.; Li, H.; Li, L.; Sui, H.; Zhang, J.L. - In: International journal of production research : American … 43 (2005) 12, pp. 2355-2358
Persistent link: https://www.econbiz.de/10006124358
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Fit capability indices and their applications
Zhang, Z.; Fang, X.D. - In: International journal of production research : American … 34 (1996) 11, pp. 3079-3094
Persistent link: https://www.econbiz.de/10006142155