Narrow search
Showing 1 - 10 of 41
Cover Image
Monte Carlo sampling approach to testing nonnested hypotheses : Monte Carlo results
Coulibaly, Nouhoun; Brorsen, B. Wade - In: Econometric reviews 18 (1999) 2, pp. 195-209
Persistent link: https://www.econbiz.de/10001371097
Cover Image
Bootstrapping a consistent nonparametric goodness-of-fit test
Fan, Yanqin - In: Econometric reviews 14 (1995) 3, pp. 367-382
Persistent link: https://www.econbiz.de/10001185180
Cover Image
A simple data-driven estimator for the semiparametric sample selection model
Escanciano, Juan Carlos; Zhu, Lin - In: Econometric reviews 34 (2015) 6/10, pp. 734-762
Persistent link: https://www.econbiz.de/10011483385
Cover Image
Marginal likelihood estimation with the cross-entropy method
Chan, Joshua; Eisenstat, Eric - In: Econometric reviews 34 (2015) 1/5, pp. 256-285
Persistent link: https://www.econbiz.de/10011373293
Cover Image
Parameter estimation in multivariate logit models with many binary choices
Bel, Koen; Fok, Dennis; Paap, Richard - In: Econometric reviews 37 (2018) 1/5, pp. 534-550
Persistent link: https://www.econbiz.de/10012039382
Cover Image
Maximum simulated likelihood estimation of the panel sample selection model
Lai, Hung-Pin; Tsay, Wen-jen - In: Econometric reviews 37 (2018) 6/10, pp. 744-759
Persistent link: https://www.econbiz.de/10012040407
Cover Image
Testing for Granger-causality in quantiles
Troster, Victor - In: Econometric reviews 37 (2018) 6/10, pp. 850-866
Persistent link: https://www.econbiz.de/10012040414
Cover Image
Bias-corrected realized variance
Yeh, Jin-huei; Wang, Jying-Nan - In: Econometric reviews 38 (2019) 2, pp. 170-192
Persistent link: https://www.econbiz.de/10012180719
Cover Image
The Gibbs sampler with particle efficient importance sampling for state-space models
Grothe, Oliver; Kleppe, Tore Selland; Liesenfeld, Roman - In: Econometric reviews 38 (2019) 10, pp. 1152-1175
Persistent link: https://www.econbiz.de/10012181399
Cover Image
Reduced forms and weak instrumentation
Phillips, Peter C. B. - In: Econometric reviews 36 (2017) 6/9, pp. 818-839
Persistent link: https://www.econbiz.de/10011795504