A Method for Correlating Field Life Degradation with Reliability Prediction for Electronic Modules
Year of publication: |
2005
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Authors: | Coit, David W. ; Evans, John L. ; Vogt, Nathan T. ; Thompson, James R. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 21.2005, 7, p. 715
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