Application of the Convergent Beam Imaging (CBIM) Technique to the Analysis of Crystal Defects
Year of publication: |
1998
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Authors: | Morniroli, Jean-Paul ; Cordier, Patrick ; Cappellen, Éric Van ; Zuo, Jin Min ; Spence, John |
Published in: |
Metall : Fachzeitschrift für Metallurgie ; Technik, Wissenschaft, Wirtschaft. - Clausthal-Zellerfeld : GDMB-Informationsges, ISSN 0026-0746, ZDB-ID 2077589. - Vol. 52.1998, 5, p. 187-202
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