Generalized Linear Model-based Control Charts for Discrete Semiconductor Process Data
Year of publication: |
2004
|
---|---|
Authors: | Skinner, Katina R. ; Montgomery, Douglas C. ; Runger, George C. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 20.2004, 8, p. 777-786
|
Saved in:
Saved in favorites
Similar items by person
-
Process monitoring for multiple count data using generalized linear model-based control charts
Skinner, Katina R., (2003)
-
Resampling methods for variable selection in robust regression
Wisnowski, James W., (2003)
-
Economic-statistical design of an adaptive chart
Prabhu, Sharad S., (1997)
- More ...