Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests
Year of publication: |
2005
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Authors: | Deshayes, Y. ; Bechou, L. ; Verdier, F. ; Danto, Y. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 21.2005, 6, p. 571-594
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