Reliability Degradation in NMOS Devices Subjected to High Energy Gamma-Ray Irradiation
Year of publication: |
1993
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Authors: | Barry, D.M. ; Meniconi, M. ; Al-Ghazi, M. |
Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 10.1993, 7, p. 16-23
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