Robust Reliability for Light Emitting Diodes using Degradation Measurements
Year of publication: |
1996
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Authors: | Chiao, C.-H. ; Hamada, M. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 12.1996, 2, p. 89-94
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