A Bayesian Approach for System Reliability Analysis With Multilevel Pass-Fail, Lifetime and Degradation Data Sets
| Year of publication: |
2013
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|---|---|
| Authors: | Peng, W ; Huang, H-Z ; Xie, M ; Yang, Y ; Liu, Y |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 62.2013, 3, p. 689-699
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