A comparison between different Monte Carlo models in simulation of hole transport in 4H-SiC
A Monte Carlo (MC) study of the hole transport in 4H-SiC is presented using three different MC models. The three models represent different approximation levels regarding band structure and scattering formulation. The most advanced model is a completely k-vector dependent full band model while the simplest model uses three analytical bands with energy dependent scattering rates. The intermediate MC model uses a full band structure calculated using a simple k·p formulation. A comparison between the models in terms of coupling constants, scattering rate, temperature dependent mobility and saturation velocity is presented.
Year of publication: |
2001
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Authors: | Nilsson, H.-E. ; Bellotti, E. ; Hjelm, M. ; Brennan, K. |
Published in: |
Mathematics and Computers in Simulation (MATCOM). - Elsevier, ISSN 0378-4754. - Vol. 55.2001, 1, p. 199-208
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Publisher: |
Elsevier |
Subject: | Monte Carlo simulation | Charge transport | Impact ionization | 4H-SiC |
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