A framework of evolution and potential impact of nanotechnology in USPTO : the SWOT analysis

Neha Saini and Prem Pandey, Amit Kumar Tiwari, Atul Kulkarni

Year of publication:	2024
Authors:	Saini, Neha ; Pandey, Prem ; Tiwari, Amit Kumar ; Kulkarni, Atul
Published in:	International journal of intellectual property management : IJIPM. - Olney, Bucks. : Inderscience Enterprises Limited, ISSN 1478-9655, ZDB-ID 2254112-3. - Vol. 14.2024, 1, p. 1-16
Subject:	cooperative patent classification \| CPC \| nanotechnology \| patent \| R&D \| SWOT \| United States Patent and Trademark Office \| USA \| USPTO \| United States \| Patent \| Nanotechnologie \| Nanotechnology \| SWOT-Analyse \| SWOT analysis \| Patentrecht \| Patent law \| Immaterialgüterrechte \| Intellectual property rights

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