A generalized correlated binomial distribution with application in multiple testing problems
| Year of publication: |
2010
|
|---|---|
| Authors: | Gupta, Ramesh ; Tao, Hui |
| Published in: |
Metrika. - Springer. - Vol. 71.2010, 1, p. 59-77
|
| Publisher: |
Springer |
| Subject: | Correlated binomial model | Beta-binomial model | False discovery rates (FDR) | Multiple testing |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10008467022