A Method for the Calculation of the Soft-error Rate of Sub-mm Dynamic Logic CMOS Circuits
Year of publication: |
1995
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Authors: | Juhnke, T. ; Bringmann, M.-P. ; Klar, H. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 11.1995, 4, p. 263-268
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