A new concept for count distributions

A new concept, called silhouette, and the related parameterization are introduced and studied. Applications show how to extend maximally the mean-variance domain of a count distribution, and how to construct a single variable for any mean-variance and any requirements on distribution shape.

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Year of publication:	2009
Authors:	Hagmark, Per-Erik
Published in:	Statistics & Probability Letters. - Elsevier, ISSN 0167-7152. - Vol. 79.2009, 8, p. 1120-1124
Publisher:	Elsevier

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Type of publication:	Article
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10005223010