A new model based on patent data for technology early warning research
Year of publication: |
2018
|
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Authors: | Guo, Ying ; Sun, Ganlu ; Zhang, Lili ; Yang, Fan ; Guo, Junfang ; Ma, Lin |
Published in: |
International journal of technology management : IJTM. - Geneva-Aeroport : Inderscience Enterprises Ltd, ISSN 0267-5730, ZDB-ID 55978-7. - Vol. 77.2018, 4, p. 210-234
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Subject: | technology early warning | patent data | forecast | technical crisis | Patent | Frühwarnsystem | Early warning system | Prognoseverfahren | Forecasting model | Technischer Fortschritt | Technological change | Welt | World |
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