A new model for measuring the impact of patent value growth trajectory
Shu-Hao Chang and Chin-Yuan Fan
| Year of publication: |
2017
|
|---|---|
| Authors: | Chang, Shu-Hao ; Fan, Chin-Yuan |
| Published in: |
International journal of technology, policy and management : IJTPM. - Olney, Bucks. : Inderscience Enterprises, ISSN 1468-4322, ZDB-ID 2113290-2. - Vol. 17.2017, 1, p. 40-57
|
| Subject: | international linkage | knowledge stock | latent growth curve model | patent analysis | patent breadth | patent value | Patent | Patentrecht | Patent law | Theorie | Theory |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011795762