A nonparametric fault isolation approach through one-class classification algorithms
Year of publication: |
2011
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Authors: | Kim, Seoung Bum ; Sukchotrat, Thuntee ; Park, Sun-Kyoung |
Published in: |
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development. - Philadelphia, Pa : Taylor & Francis, ISSN 0569-5554, ZDB-ID 2460191. - Vol. 43.2011, 7, p. 505-518
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