A Robust Bayesian Random Effects Model for Nonlinear Calibration Problems
| Year of publication: |
2012
|
|---|---|
| Authors: | Fong, Y. ; Wakefield, J. ; Rosa, S. De ; Frahm, N. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 68.2012, 4, p. 1103-1112
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010684020