A selectively calibrated derivation technique and generalized fuzzy TOPSIS for semiconductor supply chain localization assessment
Year of publication: |
2023
|
---|---|
Authors: | Chen, Toly ; Wang, Yu-Cheng ; Jiang, Pin-Hsien |
Subject: | Facility location | Localization | Semiconductor manufacturing | Supply chain | Wafer foundry | Lieferkette | Halbleiterindustrie | Semiconductor industry | Halbleiter | Semiconductor | Fuzzy-Set-Theorie | Fuzzy sets | Betriebliche Standortwahl | Firm location choice | Multikriterielle Entscheidungsanalyse | Multi-criteria analysis |
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