A sequential constant-stress accelerated life testing scheme and its Bayesian inference
| Year of publication: |
2009
|
|---|---|
| Authors: | Liu, Xiao ; Tang, Loon-Ching |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 25.2009, 1, p. 91-110
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