A Shewart-like Charting Technique for High Yield Processes
| Year of publication: |
1995
|
|---|---|
| Authors: | Xie, W. ; Xie, M. ; Goh, T.N. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 11.1995, 3, p. 189-196
|