A stochastic patent citation analysis approach to assessing future technological impacts
Year of publication: |
2012
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Authors: | Lee, Changyong ; Cho, Yangrae ; Seol, Hyeonju ; Park, Yongtae |
Published in: |
Technological forecasting & social change : an international journal. - Amsterdam : Elsevier, ISSN 0040-1625, ZDB-ID 2807002. - Vol. 79.2012, 1, p. 16-30
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