A test for independence of two stationary infinite order autoregressive processes
Year of publication: |
2005
|
---|---|
Authors: | Kim, Eunhee ; Lee, Sangyeol |
Published in: |
Annals of the Institute of Statistical Mathematics. - Springer. - Vol. 57.2005, 1, p. 105-127
|
Publisher: |
Springer |
Subject: | Independence test | infinite order autoregressive processes | the Cramér-von Mises test | residual empirical process | weak convergence |
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