A wavelet-based method for multifractal image analysis. I. Methodology and test applications on isotropic and anisotropic random rough surfaces
| Year of publication: |
2000
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|---|---|
| Authors: | Arnéodo, A. ; Decoster, N. ; Roux, S.G. |
| Published in: |
The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 15.2000, 3, p. 567-600
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| Publisher: |
Springer |
| Subject: | PACS. 47.53.+n Fractals - 02.50.-r Probability theory | stochastic processes | and statistics | 05.40.-a Fluctuation phenomena | random processes | noise | and Brownian motion | 68.35.Bs Surface structure and topography |
| Extent: | text/html |
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| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10009280026