Accelerated Ageing with in situ Electrical Testing: a Powerful Tool for the Building-in Approach to Quality and Reliability in Electronics
Year of publication: |
1994
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Authors: | Schepper, L.De ; Ceuninck, W.De ; Lekens, G. ; Stals, L. ; Vanhecke, B. ; Roggen, J. ; Beyne, E. ; Tielemans, L. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 10.1994, 1, p. 15-26
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