Accelerated life tests for products of unequal size
| Year of publication: |
1996
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|---|---|
| Authors: | Bai, D. ; Yun, H. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 45.1996, 4, p. 611-617
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