Acquisition and Testing, DT/OT Testing: The Need for Two‐Parameter Requirements
| Year of publication: |
2013
|
|---|---|
| Authors: | Hill, Raymond R. ; Gutman, Alex J. ; Chambal, Stephen P. ; Kitchen, Jerry W. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 29.2013, 5, p. 691-697
|