Adjacency-clustering and its application for yield prediction in integrated circuit manufacturing
Dorit S. Hochbaum, Sheng Liu
| Year of publication: |
November-December
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|---|---|
| Authors: | Hochbaum, Dorit S. ; Liu, Sheng |
| Published in: |
Operations research. - Catonsville, MD : INFORMS, ISSN 0030-364X, ZDB-ID 123389-0. - Vol. 66.2018, 6, p. 1571-1585
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| Subject: | Markov random field | yield prediction | semiconductor | adjacency-clustering | Prognoseverfahren | Forecasting model | Markov-Kette | Markov chain | Halbleiter | Semiconductor | Theorie | Theory | Halbleiterindustrie | Semiconductor industry |