An audit of technological innovation capabilities in chinese firms: some empirical findings in Beijing, China
Year of publication: |
2004
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Authors: | Yam, Richard C. M. ; Guan, Jian Cheng ; Pun, Kit Fai ; Tang, Esther P. Y. |
Published in: |
Research Policy. - Elsevier, ISSN 0048-7333. - Vol. 33.2004, 8, p. 1123-1140
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Publisher: |
Elsevier |
Saved in:
Online Resource
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