An improved approach for constructing lower confidence bound on process yield
Chien-Wei Wu; Mou-Yuan Liao; James C. Chen
| Year of publication: |
2012
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|---|---|
| Authors: | Wu, Chien-Wei ; Liao, Mou-Yuan ; Chen, James C. |
| Published in: |
European journal of industrial engineering : EJIE. - Genevè : Inderscience Enterprises Ltd., ISSN 1751-5254, ZDB-ID 23843779. - Vol. 6.2012, 3, p. 369-390
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| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Language: | English |
| Source: |
Persistent link: https://www.econbiz.de/10010004575