The np control chart is used widely in Statistical Process Control (SPC) for attributes. It is difficult to design an np chart that simultaneously satisfies a requirement on false alarm rate and has high detection effectiveness. This is mainly because one is often unable to make the in-control Average Run Length ARL0 of an np chart close to a specified or desired value. This article proposes a new np control chart which is able to overcome the problems suffered by the conventional np chart. It is called the Double Inspection (DI) np chart, because it uses a double inspection scheme to decide the process status (in control or out of control). The first inspection decides the process status according to the number of non-conforming units found in a sample; and the second inspection makes a decision based on the location of a particular non-conforming unit in the sample. The double inspection scheme makes the in-control ARL0 very close to a specified value and the out-of-control Average Run Length ARL1 quite small. As a result, the requirement on a false alarm rate is satisfied and the detection effectiveness also achieves a high level. Moreover, the DI np chart retains the operational simplicity of the np chart to a large degree and achieves the performance improvement without requiring extra inspection (testing whether a unit is conforming or not).
