Type of publication: Book / Working Paper
Language: English
Notes:
Chen, Yongmin and Sappington, david (2016): An Optimal Rule for Patent Damages Under Sequential Innovation.
Classification: D4 - Market Structure and Pricing ; K2 - Regulation and Business Law ; O3 - Technological Change; Research and Development
Source:
BASE
Persistent link: https://www.econbiz.de/10015253007