Analysis of Confidence Lower Limits of Reliability and Hazard Rate for Electronic Stability Control Systems
| Year of publication: |
2013
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|---|---|
| Authors: | Niu, Shiwen ; Zhan, Wei |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 29.2013, 5, p. 621-629
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