Analysis of MOS SOI Transistor Degradation
Year of publication: |
1993
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Authors: | Berland, V. ; Touboul, A. ; Flament, O. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 9.1993, 4, p. 353-358
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