Analysis of patent data : a mixed-Poisson-regression-model approach
Peiming Wang ; Iain M. Cockburn ; Martin L. Puterman
| Year of publication: |
1998
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|---|---|
| Authors: | Wang, Peiming |
| Other Persons: | Cockburn, Iain (contributor) ; Puterman, Martin L. (contributor) |
| Published in: |
Journal of business & economic statistics : JBES ; a publication of the American Statistical Association. - Alexandria, Va. : American Statistical Association, ISSN 0735-0015, ZDB-ID 876122-X. - Vol. 16.1998, 1, p. 27-41
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| Subject: | Industrieforschung | Industrial research | Patent | Skalenertrag | Returns to scale | Mikroökonometrie | Microeconometrics | Monte-Carlo-Simulation | Monte Carlo simulation | Theorie | Theory | Schätzung | Estimation | Pharmaindustrie | Pharmaceutical industry | Biotechnologie-Industrie | Biotechnology industry | USA | United States | 1976 |
| Extent: | Graph. Darst |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10001231057