Analysis of quality-caused re-entrance electrical test system in semiconductor manufacturing by Markov method
N. Li, Z. Jiang, G. Liu and Z. Zhang
| Year of publication: |
2012
|
|---|---|
| Authors: | Li, Naihe ; Jiang, Zhibin ; Liu, G. ; Zhang, Z. |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 50.2012, 12 (15.6.), p. 3486-3497
|
| Subject: | Markov model | performance evaluation | re-entrance | Markov-Kette | Markov chain | Halbleiterindustrie | Semiconductor industry | Theorie | Theory | Simulation | Elektrizitätswirtschaft | Electric power industry | Performance-Messung | Performance measurement | Halbleiter | Semiconductor |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10009575980