Analysis of step-stress accelerated-life-test data: A new approach
| Year of publication: |
1996
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|---|---|
| Authors: | Tang, L. ; Sun, Y. ; Goh, T. ; Ong, H. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 45.1996, 1, p. 69-74
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