Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits

Testing integrated circuits is a costly process. The present article investigates combinatorial optimization problems reducing subsets of tests, which are redundant in a statistical sense. The solution to those problems is brought about by application of the Simulated annealing local search technique, which, in turn makes wide use of random number generation.

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Year of publication:	2003
Authors:	Mergenthaler, W. ; Mauersberg, B. ; Feller, J. ; Stuehler, L.J. ; O’Grady, W.T. ; Ledford, J.S.
Published in:	Mathematics and Computers in Simulation (MATCOM). - Elsevier, ISSN 0378-4754. - Vol. 62.2003, 3, p. 443-451
Publisher:	Elsevier
Subject:	Redundancy elimination \| Integrated circuits \| Test cost reduction \| Simulated annealing

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Type of publication:	Article
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10010748790