Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution
| Year of publication: |
2007
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|---|---|
| Authors: | Bar-Lev, S.K. ; van der Duyn Schouten, F.A. |
| Institutions: | Tilburg University, School of Economics and Management |
| Extent: | application/pdf |
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| Series: | |
| Type of publication: | Book / Working Paper |
| Notes: | Published in Journal of Applied Statistical Science (2007), v.16, nr.1, p.115-126 |
| Source: |
Persistent link: https://www.econbiz.de/10011088971