ARTICLES - Comparisons of Exponential Life Test Plans with Intermittent Inspections
| Year of publication: |
2000
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|---|---|
| Authors: | Kim, Sun-Ho ; Yum, Bong-Jin |
| Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 32.2000, 3, p. 217-230
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